| Scanning Electron Microscopy and X-ray Microanalysis |  | Authors: Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael
Publisher: Springer
Category: Book
List Price: $99.00
Buy New: $77.22
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Seller: textbooksnow-
Sales Rank: 141,886
Media: Hardcover
Edition: 3rd
Pages: 689
Number Of Items: 1
Shipping Weight (lbs): 3.7
Dimensions (in): 10.2 x 7.4 x 2
ISBN: 0306472929
Dewey Decimal Number: 502.825
EAN: 9780306472923
ASIN: 0306472929
Publication Date: February 2003
Availability: Usually ships in 1-2 business days
Condition: Inventory subject to prior sale. Expedited orders cannot be sent to PO Box. Sorry, not able to ship to APO, FPO, Alaska, and Hawaii.
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Product Description
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.
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