| Fundamentals of Nanoscale Film Analysis |  | Authors: Terry L. Alford, L.C. Feldman, James W. Mayer
Publisher: Springer
Category: Book
List Price: $109.00
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Seller: Textbookpros
Sales Rank: 1,743,877
Media: Hardcover
Edition: 1
Pages: 350
Number Of Items: 1
Shipping Weight (lbs): 1.6
Dimensions (in): 9.2 x 6.5 x 1
ISBN: 0387292608
Dewey Decimal Number: 621.38152
EAN: 9780387292601
ASIN: 0387292608
Publication Date: February 16, 2007
Availability: Usually ships in 1-2 business days
Condition: Book leaves the warehouse the same day we get the order.
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Product Description
From materials science to integrated circuit development, much of modern technology is moving from the microscale toward the nanoscale. This book focuses on the fundamental physics underlying innovative techniques for analyzing surfaces and near-surfaces. New analytical techniques have emerged to meet these technological requirements, all based on a few processes that govern the interactions of particles and radiation with matter. This book addresses the fundamentals and application of these processes, from thin films to field effect transistors.
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