| Encyclopedia of Materials Characterization: Surfaces, Interfaces, Thin Films (Materials Characterization Series) |  | Authors: Charles Evans, Richard Brundle, Wilson
Publisher: Butterworth-Heinemann
Category: Book
List Price: $235.00
Buy Used: $35.63
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Seller: friends-of-santa-clara-city-library
Sales Rank: 977,186
Format: Braille
Media: Hardcover
Pages: 800
Number Of Items: 1
Shipping Weight (lbs): 2.5
Dimensions (in): 9.2 x 6.3 x 1.8
ISBN: 0750691689
Dewey Decimal Number: 620.44
EAN: 9780750691680
ASIN: 0750691689
Publication Date: September 1, 1992
Availability: Usually ships in 1-2 business days
Condition: This book is rated per Amazon guideline: "Acceptable: A readable copy. All pages are intact, and the cover is intact (the dust cover may be missing). Pages can include considerable notes--in pen or highlighter--but the notes cannot obscure the text." Purchasing this book benefits the Santa Clara City Library.
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Product Description
Encyclopedia of Materials Characterization is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume in the Materials Characterization Series is a unique, stand-alone reference for materials science practitioners, process engineers, students and anyone with a need to know about the capabilities available in materials analysis. An encyclopedia of 50 concise articles, this book will also be a practical companion to the forthcoming books in the Series. It describes widely-ranging techniques in a jargon-free manner and includes summary pages for each technique to supply a quick survey of its capabilities.
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