| Nanostructure Science, Metrology, and Technology (Proceedings of Spie) |  | Creators: Martin C. Peckerar, Michael T., Jr. Postek
Publisher: Society of Photo Optical
Category: Book
Buy New: $80.00
as of 2/8/2012 22:43 CST details
New (1) Used (1) from $79.50
Seller: Amazon.com
Media: Paperback
Pages: 288
ISBN: 0819443476
Dewey Decimal Number: 620.5
EAN: 9780819443472
ASIN: 0819443476
Publication Date: July 24, 2002
Availability: Temporarily out of stock. Order now and we'll deliver when available. We'll e-mail you with an estimated delivery date as soon as we have more information. Your credit card will not be charged until we ship the item.
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