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TESTING, RELIABILITY, AND APPLICATION OF MICRO-AND NANO-MATERIAL SYSTEMS 4 (Proceedings of SPIE)
	Author: Robert E. Greer Publisher: Society of Photo Optical Category: Book Buy New: $70.00 as of 5/22/2012 16:57 CDT details In Stock New (5) Used (1) from $70.00 Seller: Amazon.com Media: Paperback Pages: 1 Shipping Weight (lbs): 0.5 Dimensions (in): 10.6 x 8.1 x 0.2 ISBN: 0819462284 Dewey Decimal Number: 621.36 EAN: 9780819462282 ASIN: 0819462284 Publication Date: March 12, 2006 Shipping: Eligible for FREE Super Saver Shipping Availability: Usually ships in 1 to 3 weeks