| Electron Energy-Loss Spectroscopy in the Electron Microscope |  | Author: R.F. Egerton
Publisher: Springer
Category: Book
List Price: $279.00
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Sales Rank: 1,239,518
Media: Hardcover
Edition: 3rd ed.
Pages: 503
Number Of Items: 1
Shipping Weight (lbs): 2.3
Dimensions (in): 9.1 x 6.3 x 1.3
ISBN: 144199582X
Dewey Decimal Number: 502
EAN: 9781441995827
ASIN: 144199582X
Publication Date: July 29, 2011
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Product Description
Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level. In two previous editions, Electron Energy-Loss Spectroscopy in the Electron Microscope has become the standard reference guide to the instrumentation, physics and procedures involved, and the kind of results obtainable. Within the last few years, the commercial availability of lens-aberration correctors and electron-beam monochromators has further increased the spatial and energy resolution of EELS. This thoroughly updated and revised Third Edition incorporates these new developments, as well as advances in electron-scattering theory, spectral and image processing, and recent applications in fields such as nanotechnology. The appendices now contain a listing of inelastic mean free paths and a description of more than 20 MATLAB programs for calculating EELS data.
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